JPS62200Y2 - - Google Patents
Info
- Publication number
- JPS62200Y2 JPS62200Y2 JP1980139120U JP13912080U JPS62200Y2 JP S62200 Y2 JPS62200 Y2 JP S62200Y2 JP 1980139120 U JP1980139120 U JP 1980139120U JP 13912080 U JP13912080 U JP 13912080U JP S62200 Y2 JPS62200 Y2 JP S62200Y2
- Authority
- JP
- Japan
- Prior art keywords
- row
- extraction
- socket
- extracting
- fork
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1980139120U JPS62200Y2 (en]) | 1980-09-30 | 1980-09-30 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1980139120U JPS62200Y2 (en]) | 1980-09-30 | 1980-09-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5761841U JPS5761841U (en]) | 1982-04-13 |
JPS62200Y2 true JPS62200Y2 (en]) | 1987-01-07 |
Family
ID=29499106
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1980139120U Expired JPS62200Y2 (en]) | 1980-09-30 | 1980-09-30 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62200Y2 (en]) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0743412B2 (ja) * | 1986-01-22 | 1995-05-15 | 株式会社日立製作所 | 着脱装置 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5360764U (en]) * | 1976-10-26 | 1978-05-23 |
-
1980
- 1980-09-30 JP JP1980139120U patent/JPS62200Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS5761841U (en]) | 1982-04-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE19581661C2 (de) | Ic-Aufnahmeschalen-Lagervorrichtung und Montagevorrichtung für diese | |
DE19680785B4 (de) | Halbleiterbauelement-Testgerät und Halbleiterbauelement-Testsystem, das eine Mehrzahl von Halbleiterbauelement-Testgeräten enthält | |
DE19616809B4 (de) | Prüfmanipulator mit Drehtisch | |
US20080054925A1 (en) | Test chip socket | |
DE19817123A1 (de) | Vorrichtung zum Herausnehmen und zum Lagern von Halbleiterbauelement-Tabletts | |
US4340092A (en) | Methods of and apparatus for straightening backplane-supported pins | |
JPS62200Y2 (en]) | ||
JPH02250220A (ja) | 平面内に配線ハーネスを形成するための装置 | |
US4216580A (en) | Methods of and apparatus for assembling articles with a support | |
DE19746955A1 (de) | Prüfsystem für Halbleiterbauelemente | |
CN212207578U (zh) | 一种半测烧录治具 | |
CN221999952U (zh) | 病理玻片收纳架 | |
JPS6010634A (ja) | 半導体素子製造における自動選別装置 | |
CN221927985U (zh) | 一种用于基板的标识治具 | |
JP2570469B2 (ja) | Ic挿抜機のバーンインボード位置決め方法 | |
KR0124549Y1 (ko) | 메모리 모듈용 트레이 | |
CN210181165U (zh) | 一种用于精确取放dut的机构 | |
CN216543228U (zh) | 一种电机零部件盛装台 | |
JPH0353505Y2 (en]) | ||
CN216323384U (zh) | 一种厚薄分选机 | |
JPH0330395A (ja) | プリント配線基板分断装置 | |
DE102018207730B4 (de) | Sondierungskarten-Halteeinschub, Behälter, System und Verfahren zur Lagerung und zum Transportieren einer oder mehrerer Sondierungskarten | |
JPS5832267Y2 (ja) | 基板保持器用押上げ具 | |
JPS5931461A (ja) | 半導体装置抜取り機構 | |
CN206003749U (zh) | 一种电子仪器及其集成电路芯片打点治具 |